LNA Test: A Polynomial Coefficient Approach

Parametric fault testing of a low noise amplifier based on Taylor series expansion of input-output function is presented. We classify the circuit under test (CUT) as faulty or good based on a comparison of the polynomial coefficients of the CUT with those of the fault-free circuit. The method needs little augmentation of circuit as only a minimal set of output parameters is used for classification. We also extend this approach to fault diagnosis in conjunction with sensitivity of polynomial coefficients to circuit parameters. Experimental results show that all injected single parametric faults of sizes greater than 10% are detected and reliably diagnosed.